Bohan Lin, Yachuan Pang, Bin Gao 0006, Jianshi Tang, Dong Wu, Ting-Wei Chang, Wei-En Lin, Xiaoyu Sun, Shimeng Yu, Meng-Fan Chang, He Qian, Huaqiang Wu. A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source. J. Solid-State Circuits, 56(5):1641-1650, 2021. [doi]
Abstract is missing.