High-Frequency, At-Speed Scan Testing - researchr publication authors

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Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli. High-Frequency, At-Speed Scan Testing. IEEE Design & Test of Computers, 20(5):17-25, 2003. [doi]

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