Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli. High-Frequency, At-Speed Scan Testing. IEEE Design & Test of Computers, 20(5):17-25, 2003. [doi]
@article{LinPRRRST03,
title = {High-Frequency, At-Speed Scan Testing},
author = {Xijiang Lin and Ron Press and Janusz Rajski and Paul Reuter and Thomas Rinderknecht and Bruce Swanson and Nagesh Tamarapalli},
year = {2003},
url = {http://csdl.computer.org/comp/mags/dt/2003/05/d5017abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/LinPRRRST03},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {20},
number = {5},
pages = {17-25},
}