On Generating Fault Diagnosis Patterns for Designs with X Sources

Xijiang Lin, Sudhakar M. Reddy. On Generating Fault Diagnosis Patterns for Designs with X Sources. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-6, IEEE, 2019. [doi]

Abstract

Abstract is missing.