Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski. Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits. In 28th International Conference on VLSI Design, VLSID 2015, Bangalore, India, January 3-7, 2015. pages 399-404, IEEE Computer Society, 2015. [doi]
@inproceedings{LinRR15,
title = {Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits},
author = {Xijiang Lin and Sudhakar M. Reddy and Janusz Rajski},
year = {2015},
doi = {10.1109/VLSID.2015.73},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2015.73},
researchr = {https://researchr.org/publication/LinRR15},
cites = {0},
citedby = {0},
pages = {399-404},
booktitle = {28th International Conference on VLSI Design, VLSID 2015, Bangalore, India, January 3-7, 2015},
publisher = {IEEE Computer Society},
isbn = {978-1-4799-6658-5},
}