Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski. Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits. In 28th International Conference on VLSI Design, VLSID 2015, Bangalore, India, January 3-7, 2015. pages 399-404, IEEE Computer Society, 2015. [doi]
Abstract is missing.