Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Tonysheng Lin, Stephen Y. H. Su. VLSI Functional Test Pattern Generation: A Design and Implementation. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 922-929, IEEE Computer Society, 1985.