Stephen Y. H. Su - researchr alias

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Viewing Publication 1 - 51 from 51

1997

Fault-Tolerant Array Processors Via Reconfiguration of Two-Level Redundancy ArraysStephen Y. H. Su, Rong Yao. pdpta 1997: 1633-1642

1991

Distributed self-diagnosis of VLSI mesh array processorsMichal Cutler, Stephen Y. H. Su, Mingshien Wang. vts 1991: 178-186 [doi]

Self-Diagnosis of Faelures in VLSI Tree Array ProcessorsStephen Y. H. Su, Michal Cutler, Mingshien Wang. TC, 40(11):1252-1257, 1991.

1989

Reconfiguration of VLSI/WSI Mesh Array Processors with Two-Level RedundancyMingshien Wang, Michal Cutler, Stephen Y. H. Su. TC, 38(4):547-554, 1989.

1988

A Functional Testing Method for MicroprocessorsLi Shen, Stephen Y. H. Su. TC, 37(10):1288-1293, 1988.

Designs for Diagnosability and Reliability in VLSI SystemsStephen Y. H. Su, Hede Ma. itc 1988: 888-897

Fault Isolation in Grey SystemsStephen Y. H. Su, Hede Ma. itc 1988: 54-63

1986

Analaysis of a Class of Recovery ProceduresIsrael Koren, Zahava Koren, Stephen Y. H. Su. TC, 35(8):703-712, 1986.

1985

The S-Algorithm: A Promising Solution for Systematic Functional Test GenerationTonysheng Lin, Stephen Y. H. Su. tcad, 4(3):250-263, 1985. [doi]

VLSI Functional Test Pattern Generation: A Design and ImplementationTonysheng Lin, Stephen Y. H. Su. itc 1985: 922-929

Detecting I/O and Internal Feedback Bridging FaultsShiyi Xu, Stephen Y. H. Su. TC, 34(6):553-557, 1985.

1984

Functional Test Generation of Digital LSI/VLSI Systems Using Machine Symbolic Execution TechniqueTonysheng Lin, Stephen Y. H. Su. itc 1984: 660-668

VLSI functional testing using critical path traces at hardware description language levelLi Shen, Stephen Y. H. Su. icftcs 1984: 364-379

IDAS: an integrated design automation systemStephen Y. H. Su. afips 1984: 143-150 [doi]

Functional testing techniques for digital LSI/VLSI systemsStephen Y. H. Su, Tonysheng Lin. dac 1984: 517-528 [doi]

1983

A Simplified Algorithm for Testing MicroprocessorsKewal K. Saluja, Li Shen, Stephen Y. H. Su. itc 1983: 668-675

1982

Fault Diagnosis of MOS Combinational NetworksYacoub M. El-Ziq, Stephen Y. H. Su. TC, 31(2):129-139, 1982.

A New Fault Model and Testing Technique for CMOS DevicesChi-Chang Liaw, Stephen Y. H. Su. itc 1982: 25-34

Testing functional faults in VLSIYinghua Min, Stephen Y. H. Su. dac 1982: 384-392 [doi]

1981

State Diagram Approach for Functional Testing of Control SectionChi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya. itc 1981: 433-446

Test-Experiments for Detection and Location of Intermittent Faults in Sequential CircuitsChi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya. TC, 30(12):989-995, 1981.

Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent FaultsYashwant K. Malaiya, Stephen Y. H. Su. TC, 30(8):600-604, 1981.

Testing Functional Faults in Digital Systems Described by Register Transfer LanguageStephen Y. H. Su, Yu-I Hsieh. itc 1981: 447-457

1980

Detection and Location of Input and Feedback Bridging Faults Among Input and Output LinesMark G. Karpovsky, Stephen Y. H. Su. TC, 29(6):523-527, 1980.

Detecting bridging and stuck-at faults at input and output pins of standard digital componentsMark G. Karpovsky, Stephen Y. H. Su. dac 1980: 494-505 [doi]

A Hardware Redundancy Reconfiguration Scheme for Tolerating Multiple Module FailuresStephen Y. H. Su, Edgar DuCasse. TC, 29(3):254-258, 1980.

1979

Reliability Analysis of ::::N::::-Modular Redundancy Systems with Intermittent and Permanent FaultsIsrael Koren, Stephen Y. H. Su. TC, 28(7):514-520, 1979.

A survey of methods for intermittent fault analysisYashwant K. Malaiya, Stephen Y. H. Su. mark2 1979: 577-586 [doi]

1978

Computer-Aided Logic Design of Two-Level MOS Combinational Networks with Statistical ResultsYacoub M. El-Ziq, Stephen Y. H. Su. TC, 27(10):911-923, 1978.

A Continous-Parameter Markov Model and Detection Procedures for Intermittent FaultsStephen Y. H. Su, Israel Koren, Yashwant K. Malaiya. TC, 27(6):567-570, 1978.

A scheme for tolerating faulty data in real-time systemsJohn G. Yee, Stephen Y. H. Su. compsac 1978: 663-667 [doi]

1977

Logic design automation of diagnosable MOS combinational logic networksYacoub M. El-Ziq, Stephen Y. H. Su. dac 1977: 205-215 [doi]

Detection of Single, Stuck-Type Faulures in Multivalued Combinational NetworksRichard J. Spillman, Stephen Y. H. Su. TC, 26(12):1242-1251, 1977.

An overview of fault-tolerant digital system architectureStephen Y. H. Su, Richard J. Spillman. afips 1977: 19-26 [doi]

Hardware Description Language Applications: An Introdiction and PrognosisStephen Y. H. Su. Computer, 10(6):10-13, 1977. [doi]

1976

Identification of Multiple Stuck-Type Faults in Combinational NetworksMelvin A. Breuer, Shih-Jeh Chang, Stephen Y. H. Su. TC, 25(1):44-54, 1976.

1975

An introduction to CHDL (computer hardware description languages)Stephen Y. H. Su. sigarch, 4(3):22-23, 1975. [doi]

1974

Speculation on the future of design automationStephen Y. H. Su. dac 1974: 186-193 [doi]

A survey of computer hardware description languages in the U.S.AStephen Y. H. Su. Computer, 7(12):45-51, 1974. [doi]

Book review of Logic and logic design by B. Girling and H. G. Morning. International Textbook Company Limited 1973Stephen Y. H. Su. sigarch, 3(3):2-3, 1974. [doi]

1973

An interactive design automation systemStephen Y. H. Su. dac 1973: 253-261 [doi]

Review of "Asynchronous Sequential Switching Circuits" by S. H. UngerStephen Y. H. Su. tsmc, 3(3):302, 1973. [doi]

Review of "Fault Diagnosis of Digital Systems" by H. Y. Chang, E. G. Manning, and G. MetzeStephen Y. H. Su. tsmc, 3(3):301, 1973. [doi]

B73-12 Fault Detection in Digital CircuitsStephen Y. H. Su. TC, 22(5):547, 1973. [doi]

1972

The Relationship Between Multivalued Switching Algebra and Boolean Algebra Under Different Definitions of ComplementStephen Y. H. Su, Achilles A. Sarris. TC, 21(5):479-485, 1972. [doi]

A New Approach to the Fault Location of Combinational CircuitsStephen Y. H. Su, Yun-Chung Cho. TC, 21(1):21-30, 1972. [doi]

Computer Minimization of Multivalued Switching FunctionsStephen Y. H. Su, Peter T. Cheung. TC, 21(9):995-1003, 1972. [doi]

1971

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