Mark G. Karpovsky, Stephen Y. H. Su. Detecting bridging and stuck-at faults at input and output pins of standard digital components. In Edwin B. Hassler Jr., editor, Proceedings of the 17th Design Automation Conference, DAC '80, Minneapolis, Minnesota, USA, June 23-25, 1980. pages 494-505, ACM/IEEE, 1980. [doi]
Abstract is missing.