Using an artificial neural network prediction model to optimize work-in-process inventory level for wafer fabrication

Yu-Hsin Lin, Jie-Ren Shie, Chih-Hung Tsai. Using an artificial neural network prediction model to optimize work-in-process inventory level for wafer fabrication. Expert Syst. Appl., 36(2):3421-3427, 2009. [doi]

Authors

Yu-Hsin Lin

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Jie-Ren Shie

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Chih-Hung Tsai

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