Using an artificial neural network prediction model to optimize work-in-process inventory level for wafer fabrication

Yu-Hsin Lin, Jie-Ren Shie, Chih-Hung Tsai. Using an artificial neural network prediction model to optimize work-in-process inventory level for wafer fabrication. Expert Syst. Appl., 36(2):3421-3427, 2009. [doi]

Abstract

Abstract is missing.