Yu-Hsin Lin, Jie-Ren Shie, Chih-Hung Tsai. Using an artificial neural network prediction model to optimize work-in-process inventory level for wafer fabrication. Expert Syst. Appl., 36(2):3421-3427, 2009. [doi]
@article{LinST09,
title = {Using an artificial neural network prediction model to optimize work-in-process inventory level for wafer fabrication},
author = {Yu-Hsin Lin and Jie-Ren Shie and Chih-Hung Tsai},
year = {2009},
doi = {10.1016/j.eswa.2008.02.009},
url = {http://dx.doi.org/10.1016/j.eswa.2008.02.009},
tags = {optimization, process modeling},
researchr = {https://researchr.org/publication/LinST09},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {36},
number = {2},
pages = {3421-3427},
}