Yuwen Dave Lin, Charles H.-P. Wen, Herming Chiueh. Radiation-Hardened Designs for Soft-Error-Rate Reduction by Delay-Adjustable D-Flip-Flops. In Laleh Behjat, Jie Han, Miroslav N. Velev, Deming Chen, editors, Proceedings of the on Great Lakes Symposium on VLSI 2017, Banff, AB, Canada, May 10-12, 2017. pages 197-202, ACM, 2017. [doi]
Abstract is missing.