Saihua Lin, Huazhong Yang. Worst Case Crosstalk Noise Effect Analysis in DSM Circuits by ABCD Modeling. In Johan Vounckx, Nadine Azémard, Philippe Maurine, editors, Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 16th International Workshop, PATMOS 2006, Montpellier, France, September 13-15, 2006, Proceedings. Volume 4148 of Lecture Notes in Computer Science, pages 504-513, Springer, 2006. [doi]