TRIAD: A triple patterning lithography aware detailed router

Yen-Hung Lin, Bei Yu, David Z. Pan, Yih-Lang Li. TRIAD: A triple patterning lithography aware detailed router. In 2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012. pages 123-129, IEEE, 2012. [doi]

Abstract

Abstract is missing.