Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik. PSBIST: A Partial-Scan Based Built-In Self-Test Scheme. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 507-516, IEEE Computer Society, 1993.
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