Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

J. Th. van der Linden, M. H. Konijnenburg, A. J. van de Goor. Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors. In 5th Asian Test Symposium (ATS 96), November 20-22, 1996, Hsinchu, Taiwan. pages 29-33, IEEE Computer Society, 1996. [doi]

This author has not been identified. Look up 'J. Th. van der Linden' in GoogleThis author has not been identified. Look up 'M. H. Konijnenburg' in GoogleThis author has not been identified. Look up 'A. J. van de Goor' in Google

runs on WebDSL