J. Th. van der Linden, M. H. Konijnenburg, A. J. van de Goor. Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors. In 5th Asian Test Symposium (ATS 96), November 20-22, 1996, Hsinchu, Taiwan. pages 29-33, IEEE Computer Society, 1996. [doi]
Abstract is missing.