Fast Enhancement of Validation Test Sets for Improving the Stuck-at Fault Coverage of RTL Circuits

Loganathan Lingappan, Vijay Gangaram, Niraj K. Jha, Sreejit Chakravarty. Fast Enhancement of Validation Test Sets for Improving the Stuck-at Fault Coverage of RTL Circuits. IEEE Trans. VLSI Syst., 17(5):697-708, 2009. [doi]

Abstract

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