Loganathan Lingappan, Niraj K. Jha. Improving the Performance of Automatic Sequential Test Generation by Targeting Hard-to-Test Faults. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 431-436, IEEE Computer Society, 2006. [doi]
@inproceedings{LingappanJ06,
title = {Improving the Performance of Automatic Sequential Test Generation by Targeting Hard-to-Test Faults},
author = {Loganathan Lingappan and Niraj K. Jha},
year = {2006},
doi = {10.1109/VLSID.2006.104},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.104},
tags = {testing},
researchr = {https://researchr.org/publication/LingappanJ06},
cites = {0},
citedby = {0},
pages = {431-436},
booktitle = {19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2502-4},
}