Lionel Vincent, Philippe Maurine, Suzanne Lesecq, Edith Beigné. Embedding statistical tests for on-chip dynamic voltage and temperature monitoring. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 994-999, ACM, 2012. [doi]
@inproceedings{LionelPSE12,
title = {Embedding statistical tests for on-chip dynamic voltage and temperature monitoring},
author = {Lionel Vincent and Philippe Maurine and Suzanne Lesecq and Edith Beigné},
year = {2012},
doi = {10.1145/2228360.2228539},
url = {http://doi.acm.org/10.1145/2228360.2228539},
researchr = {https://researchr.org/publication/LionelPSE12},
cites = {0},
citedby = {0},
pages = {994-999},
booktitle = {The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012},
editor = {Patrick Groeneveld and Donatella Sciuto and Soha Hassoun},
publisher = {ACM},
isbn = {978-1-4503-1199-1},
}