Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices

Jing-Jia Liou, Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng. Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices. IEEE Trans. on CAD of Integrated Circuits and Systems, 22(6):756-769, 2003. [doi]

Authors

Jing-Jia Liou

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Angela Krstic

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Yi-Min Jiang

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Kwang-Ting Cheng

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