Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams. Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 407-416, IEEE Computer Society, 2002. [doi]
Abstract is missing.