Bernhard Lippmann, Ann-Christin Bette, Matthias Ludwig 0005, Johannes Mutter, Johanna Baehr, Alexander Hepp, Horst A. Gieser, Nicola Kovac, Tobias Zweifel, Martin Rasche, Oliver Kellermann. Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 796-801, IEEE, 2022. [doi]
@inproceedings{LippmannBLMBHGK22,
title = {Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions},
author = {Bernhard Lippmann and Ann-Christin Bette and Matthias Ludwig 0005 and Johannes Mutter and Johanna Baehr and Alexander Hepp and Horst A. Gieser and Nicola Kovac and Tobias Zweifel and Martin Rasche and Oliver Kellermann},
year = {2022},
doi = {10.23919/DATE54114.2022.9774610},
url = {https://doi.org/10.23919/DATE54114.2022.9774610},
researchr = {https://researchr.org/publication/LippmannBLMBHGK22},
cites = {0},
citedby = {0},
pages = {796-801},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022},
editor = {Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu},
publisher = {IEEE},
isbn = {978-3-9819263-6-1},
}