Vanco B. Litovski, Mark Zwolinski, Miona Andrejevic. Behavioural modelling, simulation, test and diagnosis of MEMS using ANNs. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 5182-5185, IEEE, 2005. [doi]
Abstract is missing.