Martin Litzenberger, R. Pichler, Scrgey Bychikhin, Dionyz Pogany, E. Gornik, K. Esmark, Harald Gossner. Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectronics Reliability, 41(9-10):1385-1390, 2001.
@article{LitzenbergerPBPGEG01,
title = {Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices},
author = {Martin Litzenberger and R. Pichler and Scrgey Bychikhin and Dionyz Pogany and E. Gornik and K. Esmark and Harald Gossner},
year = {2001},
researchr = {https://researchr.org/publication/LitzenbergerPBPGEG01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {9-10},
pages = {1385-1390},
}