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Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices

Martin Litzenberger, R. Pichler, Scrgey Bychikhin, Dionyz Pogany, E. Gornik, K. Esmark, Harald Gossner. Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectronics Reliability, 41(9-10):1385-1390, 2001.

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