Yingdi Liu, Nilanjan Mukherjee 0001, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer. Deterministic Stellar BIST for In-System Automotive Test. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-9, IEEE, 2018. [doi]
Abstract is missing.