Weihua Liu, Fei Wu 0005, Meng Zhang, Yifei Wang, Zhonghai Lu, Xiangfeng Lu, Changsheng Xie. Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 312-315, IEEE, 2019. [doi]
Abstract is missing.