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Assessment methodology of the lateral migration component in data retention of 3D SONOS memories

Lifang Liu, Antonio Arreghini, Geert Van den bosch, Liyang Pan, Jan Van Houdt. Assessment methodology of the lateral migration component in data retention of 3D SONOS memories. Microelectronics Reliability, 54(9-10):1697-1701, 2014. [doi]

Authors

Lifang Liu

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Antonio Arreghini

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Geert Van den bosch

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Liyang Pan

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Jan Van Houdt

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