Lifang Liu, Antonio Arreghini, Geert Van den bosch, Liyang Pan, Jan Van Houdt. Assessment methodology of the lateral migration component in data retention of 3D SONOS memories. Microelectronics Reliability, 54(9-10):1697-1701, 2014. [doi]
@article{LiuAbPH14,
title = {Assessment methodology of the lateral migration component in data retention of 3D SONOS memories},
author = {Lifang Liu and Antonio Arreghini and Geert Van den bosch and Liyang Pan and Jan Van Houdt},
year = {2014},
doi = {10.1016/j.microrel.2014.07.070},
url = {http://dx.doi.org/10.1016/j.microrel.2014.07.070},
researchr = {https://researchr.org/publication/LiuAbPH14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {9-10},
pages = {1697-1701},
}