Chunsheng Liu, Krishnendu Chakrabarty. A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 10230-10237, IEEE Computer Society, 2003. [doi]
Abstract is missing.