Testing, diagnosis and repair methods for NBTI-induced SRAM faults

Bao Liu, Chiung-Hung Chen. Testing, diagnosis and repair methods for NBTI-induced SRAM faults. In 2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014. pages 1-4, IEEE, 2014. [doi]

Authors

Bao Liu

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Chiung-Hung Chen

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