Bao Liu, Chiung-Hung Chen. Testing, diagnosis and repair methods for NBTI-induced SRAM faults. In 2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014. pages 1-4, IEEE, 2014. [doi]
@inproceedings{LiuC14-30,
title = {Testing, diagnosis and repair methods for NBTI-induced SRAM faults},
author = {Bao Liu and Chiung-Hung Chen},
year = {2014},
doi = {10.1109/ICICDT.2014.6838608},
url = {http://dx.doi.org/10.1109/ICICDT.2014.6838608},
researchr = {https://researchr.org/publication/LiuC14-30},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014},
publisher = {IEEE},
isbn = {978-1-4799-2153-9},
}