S. E. Liu, G. Y. Chen, M. K. Chen, David. Yen, W. A. Kuo, C. S. Fu, Y. S. Tsai, M. Z. Lin, Y. H. Fang, M. J. Lin. Fast chip aging prediction by product-like VMIN drift characterization on test structures. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 3, IEEE, 2018. [doi]
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