Chunsheng Liu, Krishnendu Chakrabarty, Michael Gössel. An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 382-386, IEEE Computer Society, 2002. [doi]
@inproceedings{LiuCG02,
title = {An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment},
author = {Chunsheng Liu and Krishnendu Chakrabarty and Michael Gössel},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/date/2002/1471/00/14710382abs.htm},
tags = {rule-based, meta-model, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/LiuCG02},
cites = {0},
citedby = {0},
pages = {382-386},
booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1471-5},
}