Ren-Shuo Liu, Yun-Sheng Chang, Chih-Wen Hung. VST: A virtual stress testing framework for discovering bugs in SSD flash-translation layers. In 2017 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2017, Irvine, CA, USA, November 13-16, 2017. pages 283-290, IEEE, 2017. [doi]
Abstract is missing.