Comprehensive Pulse Shape Induced Failure Analysis in Voltage-Controlled MRAM - researchr publication authors

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Mingyue Liu, Hao Cai, Menglin Han, Lei Xie, Jun Yang, Lirida A. B. Naviner. Comprehensive Pulse Shape Induced Failure Analysis in Voltage-Controlled MRAM. In IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2019, Qingdao, China, July 17-19, 2019. pages 1-6, IEEE, 2019. [doi]

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