Mingyue Liu, Hao Cai, Menglin Han, Lei Xie, Jun Yang, Lirida A. B. Naviner. Comprehensive Pulse Shape Induced Failure Analysis in Voltage-Controlled MRAM. In IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2019, Qingdao, China, July 17-19, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{LiuCHXYN19,
title = {Comprehensive Pulse Shape Induced Failure Analysis in Voltage-Controlled MRAM},
author = {Mingyue Liu and Hao Cai and Menglin Han and Lei Xie and Jun Yang and Lirida A. B. Naviner},
year = {2019},
doi = {10.1109/NANOARCH47378.2019.181292},
url = {https://doi.org/10.1109/NANOARCH47378.2019.181292},
researchr = {https://researchr.org/publication/LiuCHXYN19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2019, Qingdao, China, July 17-19, 2019},
publisher = {IEEE},
isbn = {978-1-7281-5520-3},
}