An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits

Baojun Liu, Li Cai, Xiaoqiang Liu. An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits. J. Electronic Testing, 36(4):461-467, 2020. [doi]

Abstract

Abstract is missing.