Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Baojun Liu, Li Cai, Yan Li, Qiang Kang. Reliability for nanomagnetic logic (NML) readout circuit under single event effect. Microelectronics Journal, 46(1):20-26, 2015. [doi]
Abstract is missing.