Shi-Tang Liu, Jia-Xian Chen, Yu-Tsung Wu, Chao-Ho Hsieh, Chien-Mo James Li, Norman Chang, Ying Shiun Li, Wentze Chuang. Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor. In 23rd International Symposium on Quality Electronic Design, ISQED 2022, Santa Clara, CA, USA, April 6-7, 2022. pages 27-32, IEEE, 2022. [doi]
@inproceedings{LiuCWHLCLC22,
title = {Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor},
author = {Shi-Tang Liu and Jia-Xian Chen and Yu-Tsung Wu and Chao-Ho Hsieh and Chien-Mo James Li and Norman Chang and Ying Shiun Li and Wentze Chuang},
year = {2022},
doi = {10.1109/ISQED54688.2022.9806245},
url = {https://doi.org/10.1109/ISQED54688.2022.9806245},
researchr = {https://researchr.org/publication/LiuCWHLCLC22},
cites = {0},
citedby = {0},
pages = {27-32},
booktitle = {23rd International Symposium on Quality Electronic Design, ISQED 2022, Santa Clara, CA, USA, April 6-7, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9466-3},
}