Shi-Tang Liu, Jia-Xian Chen, Yu-Tsung Wu, Chao-Ho Hsieh, Chien-Mo James Li, Norman Chang, Ying Shiun Li, Wentze Chuang. Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor. In 23rd International Symposium on Quality Electronic Design, ISQED 2022, Santa Clara, CA, USA, April 6-7, 2022. pages 27-32, IEEE, 2022. [doi]
Abstract is missing.