A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters - researchr publication authors

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Tao Liu, Chao Fu, Sule Ozev, Bertan Bakkaloglu. A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]

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