Tao Liu, Chao Fu, Sule Ozev, Bertan Bakkaloglu. A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{LiuFOB14,
title = {A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters},
author = {Tao Liu and Chao Fu and Sule Ozev and Bertan Bakkaloglu},
year = {2014},
doi = {10.1109/VTS.2014.6818750},
url = {http://dx.doi.org/10.1109/VTS.2014.6818750},
researchr = {https://researchr.org/publication/LiuFOB14},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014},
publisher = {IEEE},
}