Dick L. Liu, Rajesh Galivanche, Charlie C. Hsu. An automatic test pattern generation program for large ASICs. In Computer Design: VLSI in Computers and Processors, ICCD 1989. Proceedings., 1989 IEEE International Conference on, Cambridge, MA, USA, October 2-4, 1989. pages 244-248, IEEE, 1989. [doi]
@inproceedings{LiuGH89, title = {An automatic test pattern generation program for large ASICs}, author = {Dick L. Liu and Rajesh Galivanche and Charlie C. Hsu}, year = {1989}, doi = {10.1109/ICCD.1989.63364}, url = {https://doi.org/10.1109/ICCD.1989.63364}, researchr = {https://researchr.org/publication/LiuGH89}, cites = {0}, citedby = {0}, pages = {244-248}, booktitle = {Computer Design: VLSI in Computers and Processors, ICCD 1989. Proceedings., 1989 IEEE International Conference on, Cambridge, MA, USA, October 2-4, 1989}, publisher = {IEEE}, isbn = {0-8186-1971-6}, }