Dick L. Liu, Rajesh Galivanche, Charlie C. Hsu. An automatic test pattern generation program for large ASICs. In Computer Design: VLSI in Computers and Processors, ICCD 1989. Proceedings., 1989 IEEE International Conference on, Cambridge, MA, USA, October 2-4, 1989. pages 244-248, IEEE, 1989. [doi]
Abstract is missing.