Shanshan Liu, Jing Guo 0004, Xiaochen Tang, Pedro Reviriego, Fabrizio Lombardi. A Polarity-Driven Radiation-Hardened Latch design for Single Event Upset Tolerance. In Luca Cassano, Sreejit Chakravarty, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.