Cheng Liu, Jingjing Gu, Zujia Yan, Fuzhen Zhuang, Yunyun Wang. SDC-causing Error Detection Based on Lightweight Vulnerability Prediction. In Wee Sun Lee, Taiji Suzuki, editors, Proceedings of The 11th Asian Conference on Machine Learning, ACML 2019, 17-19 November 2019, Nagoya, Japan. Volume 101 of Proceedings of Machine Learning Research, pages 1049-1064, PMLR, 2019. [doi]
@inproceedings{LiuGYZW19,
title = {SDC-causing Error Detection Based on Lightweight Vulnerability Prediction},
author = {Cheng Liu and Jingjing Gu and Zujia Yan and Fuzhen Zhuang and Yunyun Wang},
year = {2019},
url = {http://proceedings.mlr.press/v101/liu19c.html},
researchr = {https://researchr.org/publication/LiuGYZW19},
cites = {0},
citedby = {0},
pages = {1049-1064},
booktitle = {Proceedings of The 11th Asian Conference on Machine Learning, ACML 2019, 17-19 November 2019, Nagoya, Japan},
editor = {Wee Sun Lee and Taiji Suzuki},
volume = {101},
series = {Proceedings of Machine Learning Research},
publisher = {PMLR},
}