An On-line Variable Speed Scanning Method with Machine Learning Based Feedforward Control for Atomic Force Microscopy - researchr publication authors

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Yi-Lin Liu, Ching-Chi Huang, Huang-Chih Chen, Li-Chen Fu. An On-line Variable Speed Scanning Method with Machine Learning Based Feedforward Control for Atomic Force Microscopy. In 12th Asian Control Conference, ASCC 2019, Kitakyushu-shi, Japan, June 9-12, 2019. pages 138-143, IEEE, 2019. [doi]

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